Skip to content

Menu

Links

Search

Company
Life Science
Biophysics
Physical Science
Material Science
Industry
- Industrial Spectrophotometers and Spectrometers
- Advanced Industry Laser Systems
Support
Contact us

Close Menu

Home » Material Science » Semiconductor characterization

Semiconductor characterization

THIN FILM CHARACTERIZATION, RESISTIVITY MEASUREMENT FOR SEMI-INSULATORS, HALL EFFECT, NANO SURFACE CHARACTERIZATION (AFM), NANOINDENTER

THIN FILM CHARACTERIZATION

Spectroscopic Ellipsometer

RESISTIVITY MEASUREMENT FOR SEMI-INSULATORS

corema-2000-contactless-resistivity-mapping-system-for-semi-insulating-wafers

HALL EFFECT

HALL EFFECT

NANO SURFACE CHARACTERIZATION (AFM)

NANO SURFACE CHARACTERIZATION

NANOINDENTER

Nanoindenter

CRISEL INSTRUMENTS S.R.L.
Via Mattia Battistini, 177
00167 Roma – Italia

Tel: +39 06 35402933

Privacy Policy
Cookie Policy

Copyright © 2026 - Crisel Instruments S.r.l. - All rights reserved. P.IVA 04703401002 Sito realizzato da Proimago